Ensemble Diffraction Microscopy: An Imaging Technique That Allows High-Resolution Diffraction Imaging Using Both Totally and Partially Coherent Sources

Coherent diffraction microscopy (CDM) is a potential approach to image micromaterials at atomic resolution without crystals. Due the lack of high-angle scattering, achieved limited several nanometers. Small-angle scattering allows researchers reveal high-resolution 3D structures specimens by fitting 1D signals. However, prerequisite models and non-unique solutions restrict general specimens. Under assumption an ensemble containing large amounts identical with same orientation, intensity distribution pattern whole approximated form factor single specimen multiplied number Since intensities are contributed from ensemble, signal can be significantly extended high-frequency regions. The feasibility (EDM) was demonstrated designed sample using both totally partially coherent X-ray sources Taiwan Photon Source (TPS). reconstructed images show excellent consistency scanning electron microscope. This work represents new protocol for directly characterizing nanomaterials, or potentially biomacromolecules, accumulated data.